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Quantitative Specimen Electric Potential Maps Using Segmented and Pixel Detectors in Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 442-443
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- July 2017
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C22 Quantitative Sub-100nm Phase-Contrast Imaging Using an SEM-Based Full-Field X-ray Microscope—Invited
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- Journal:
- Powder Diffraction / Volume 20 / Issue 2 / June 2005
- Published online by Cambridge University Press:
- 20 May 2016, p. 173
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Electron Singularities, Matter Wave Catastrophes, and Vortex Lattice Singularimetry
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 673-674
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- August 2015
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Quantitative Visible-Light and Electron Phase Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 408-409
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- July 1998
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Quantitative Non-Interferometric X-Ray Phase Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 360-361
- Print publication:
- July 1998
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